XRF analysis of bronze castings after recasting.
نویسندگان
چکیده
منابع مشابه
Experimental Parameters for XRF Analysis of Soils
Harmful elements (Pb, Se, Cd, etc.) in the soil samples were measured by X-ray fluorescence (XRF) method. We investigated the influence of the thickness of soil layer, the grain size of soils, and the water content in soils on XRF intensity. Since high-energy XRF such as Cd K was detected in deep inside of soils, a thickness of 10 mm was recommended. The soil sample with a small grain size gave...
متن کاملField portable XRF analysis of environmental samples.
One of the critical factors for successfully conducting contamination characterization, removal, and remedial operations at hazardous waste sites is rapid and appropriate response to analyze samples in a timely fashion. Turnaround time associated with off-site analysis is often too slow to support efficient utilization of the data. Field portable X-ray fluorescence (FPXRF) techniques provide vi...
متن کاملPIXE and XRF analysis of honey samples
The systematic determination of trace-element concentrations in honey samples was done by the PIXE method using a 2 MeV proton beam and by the total reflection XRF method. The different kinds of honey samples were collected in the period of spring–summer in three places of Poland: in the centre of Warsaw (a highly polluted region) and about 100 km east of Warsaw and 70 km southwest of Warsaw (a...
متن کاملRecasting MLF
The language MLF has been proposed as an alternative to System F that permits partial type inference a la ML. It differs from System F by its types and type-instance relation. Unfortunately, the definition of type instance is only syntactic, and not underpinned by some underlying semantics. It has so far only been justified a posteriori by the type soundness result. In this work, we revisit MLF...
متن کاملXRF-FP is a full-featured quantitative analysis package for XRF
AMPTEK INC. 14 DeAngelo Drive, Bedford, MA 01730-2204 U.S.A. APPLICATIONS • X-Ray Fluorescence • Thin-film Analysis • RoHS/WEEE Analysis • Teaching and Research • Art and Archaeology • Process Control • X-ray Tube Characterization FEATURES • Fundamental parameters (FP) • Analysis with or without standards • General bulk and thin-film analysis • Analyze up to 40 elements • Supports all Amptek de...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: BUNSEKI KAGAKU
سال: 1988
ISSN: 0525-1931
DOI: 10.2116/bunsekikagaku.37.11_t152